A New Method for Evaluating Slit-Smeared Small Angle X-Ray Scattering Data
G.R. Strobl. Acta Crystallographica A 26, 367-375 (1970)
Abstract
A new method for evaluating slit-smeared small-angle scattering data is discussed. It is applicable to any primary beam-intensity distribution. The propagation of measuring errors is examined; expressions for the computation of the precision of all derived pinhole scattering curve properties are given. There is no need to smooth the measured curve before applying the evaluation procedures. The method turns out to be very suitable for practical use.