The Use of X-ray and Neutron Reflectometry for the Investigation of Polymeric Thin Films

Abstract

The techniques of X-ray and neutron reflectometry are compared with respect to their application for the investigation of polymeric thin films. While the use of X-ray reflectometry is limited due to the small contrast between most polymers, deuteration offers many possibilities for neutron reflectometry. Some specific examples from our laboratory for the investigation of polymer thin films and interfaces between polymers are discussed. Various interfacial parameters such as interface width and interface profile can be obtained with subnanometer resolution. A combination of both techniques helps to reduce fit parameters and yields optimal information.