Structure of Thin Block-Copolymers Films Studied by X-Ray Reflectivity
R. Mutter, G. Strobl, B. Stühn. Fresenius Journal of Analytical Chemistry 346, 297-299 (1993)
Abstract
X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.