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Master Laboratory Applied Physics

Lab 4 - Atomic Force Microscopy (AFM)

(for appointment arrangement please contact Silvia Siegenführ)

The aim of this practical course experiment is to give the students an insight into the technique of scanning probe microscopy (SPM) with an atomic force microscope (AFM) taken as example. AFM is widely‐used to image surface structures (on a nm or even sub‐nm scale scale) and to measure surface forces. AFM is an up‐to‐date (sophisticated) method for studying various properties of surfaces. In this lab course, the focus is on measuring topography and viscoelastic contrast of surfaces of various materials.

The experiment is typically performed in teams of two students.

Silvia Siegenführ
Dr. Thomas Pfohl
Prof. Günter Reiter


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